数电实验18：数码管扫描显示

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概述

代码段

module Top(
	   input ST,		
      input CLR,		
      input clk_25M,		
      output [3:0] AN,
      output [7:0] SEG
    );
    
	reg[15:0] Data;
	reg[3:0] Data_Show; 
	wire[1:0] BIT_SEL;
	reg Increment;
	integer clk_num=0;
	
	delay_2ms uu1(clk_25M,BIT_SEL);

initial begin Data <= 16'b0; Increment = 1'b0;end

	always@(posedge clk_25M)begin	
		if(clk_num<5000000)	begin
			clk_num = clk_num+1;
			Increment = 1'b0;
		end
		else begin
			clk_num = 0;
			Increment = 1'b1;
		end
	end
								
	always@(posedge CLR  or posedge Increment)
	if(CLR) begin
		Data <= 16'b0000000000000000;
	end		
	else if(ST) begin
		if(Data[3:0]==4'b1001) begin
			Data[3:0]<=4'b0000;
			if(Data[7:4]==4'b1001) begin
				Data[7:4]<=4'b0000;
				if(Data[11:8]==4'b1001)begin
					Data[11:8]<=4'b0000;
					if(Data[15:12]==4'b1001)
						Data[15:12]<=4'b0000;
					else
						Data[15:12]<=Data[15:12]+4'b0001;
				end
				else
					Data[11:8]<=Data[11:8]+4'b0001;
			end
			else
				Data[7:4]<=Data[7:4]+4'b0001;
		end
		else
			Data[3:0]<=Data[3:0]+4'b0001;
	end

	always @(*) begin
		case(BIT_SEL)
			0:Data_Show[3:0]<=Data[15:12];
			1:Data_Show[3:0]<=Data[11:8];
			2:Data_Show[3:0]<=Data[7:4];
			3:Data_Show[3:0]<=Data[3:0];
			default:Data_Show[3:0]<=Data[3:0];
		endcase
	end
	
	SMG uu2(Data_Show,BIT_SEL,SEG,AN);	
endmodule

module delay_2ms(
		input clk_25M,
		output reg[1:0] BIT_SEL
);
	integer cnt=0;
	
	initial begin BIT_SEL <= 2'b00; end
	
	always@(posedge clk_25M) begin
		cnt<=cnt+1;
		if(cnt>50000) begin
			BIT_SEL<=BIT_SEL+2'b01;
			cnt<=0;
		end
	end
endmodule

module SMG(
	  input wire[3:0] Data,
      input wire[1:0] Bit_sel,
      output reg[7:0] Seg,
      output reg[3:0] AN
);
	always @(*) begin
		case(Bit_sel)
			2'b00:AN<=4'b1000;
			2'b01:AN<=4'b1001;
			2'b10:AN<=4'b1010;
			2'b11:AN<=4'b1011;
			default:AN<=4'b1111;
		endcase
	end
	always @(*)	begin
		case(Data[3:0])
			0:Seg[7:0]<=8'b00000011;
			1:Seg[7:0]<=8'b10011111;
			2:Seg[7:0]<=8'b00100101;
			3:Seg[7:0]<=8'b00001101;
			4:Seg[7:0]<=8'b10011001;
			5:Seg[7:0]<=8'b01001001;
			6:Seg[7:0]<=8'b01000001;
			7:Seg[7:0]<=8'b00011111;
			8:Seg[7:0]<=8'b00000001;
			9:Seg[7:0]<=8'b00001001;
			10:Seg[7:0]<=8'b00010001;
			11:Seg[7:0]<=8'b11000001;
			12:Seg[7:0]<=8'b01100011;
			13:Seg[7:0]<=8'b10000101;
			14:Seg[7:0]<=8'b01100001;
			15:Seg[7:0]<=8'b01110001;
			default:Seg[7:0]<=8'b11111111;
		endcase
	end
endmodule

测试文件

module test;

	// Inputs
	reg ST;
	reg CLR;
	reg clk_25M;

	// Outputs
	wire [3:0] AN;
	wire [7:0] SEG;

	// Instantiate the Unit Under Test (UUT)
	Top uut (
		.ST(ST), 
		.CLR(CLR), 
		.clk_25M(clk_25M), 
		.AN(AN), 
		.SEG(SEG)
	);

		always #20 clk_25M=~clk_25M;
		initial begin		
		CLR = 0;
		ST= 0;
		clk_25M = 0;
		
		#100;
      CLR = 0;
		ST= 1;		
	end  
      
endmodule

管脚配置

# PlanAhead Generated IO constraints 

NET "AN[3]" IOSTANDARD = LVCMOS18;
NET "AN[2]" IOSTANDARD = LVCMOS18;
NET "AN[1]" IOSTANDARD = LVCMOS18;
NET "AN[0]" IOSTANDARD = LVCMOS18;
NET "SEG[7]" IOSTANDARD = LVCMOS18;
NET "SEG[6]" IOSTANDARD = LVCMOS18;
NET "SEG[5]" IOSTANDARD = LVCMOS18;
NET "SEG[4]" IOSTANDARD = LVCMOS18;
NET "SEG[3]" IOSTANDARD = LVCMOS18;
NET "SEG[2]" IOSTANDARD = LVCMOS18;
NET "SEG[1]" IOSTANDARD = LVCMOS18;
NET "SEG[0]" IOSTANDARD = LVCMOS18;
NET "clk_25M" IOSTANDARD = LVCMOS18;
NET "CLR" IOSTANDARD = LVCMOS18;
NET "ST" IOSTANDARD = LVCMOS18;

# PlanAhead Generated physical constraints 

NET "clk_25M" LOC = H4;
NET "CLR" LOC = T3;
NET "ST" LOC = U3;

# PlanAhead Generated IO constraints 

NET "CLR" PULLDOWN;
NET "ST" PULLDOWN;

# PlanAhead Generated physical constraints 

NET "AN[3]" LOC = L21;
NET "AN[2]" LOC = M22;
NET "AN[1]" LOC = M21;
NET "AN[0]" LOC = N22;
NET "SEG[7]" LOC = H19;
NET "SEG[6]" LOC = G20;
NET "SEG[5]" LOC = J22;
NET "SEG[4]" LOC = K22;
NET "SEG[3]" LOC = K21;
NET "SEG[2]" LOC = H20;
NET "SEG[1]" LOC = H22;
NET "SEG[0]" LOC = J21;